Professor Lee's Scholarship Cited by Judge Posner in New Republic Article
Judge Richard Posner of the U.S. Court of Appeals for the Seventh Circuit referenced the scholarship of Professor Peter Lee in a recent article appearing in the New Republic. The article addresses Judge Posner's views on voter ID laws as well as his broader reflections on the challenges of adjudicating highly complex cases. Judge Posner quotes Professor Lee's 2010 Yale Law Journal article, "Patent Law and the Two Cultures," which explores the difficulties that judges face when adjudicating cases involving technologically complicated subject matter.
Professor Lee's scholarly work addresses the intersection of science and society, particularly exploring the patent system's impact on scientific and technological progress.